On-Wafer Microwave Measurements and De-embedding

Download or read book On-Wafer Microwave Measurements and De-embedding written by Errikos Lourandakis and published by Artech House. This book was released on 2016-07-31 with total page 251 pages. Available in PDF, EPUB and Kindle. Book excerpt: This new authoritative resource presents the basics of network analyzer measurement equipment and troubleshooting errors involved in the on-wafer microwave measurement process. This book bridges the gap between theoretical and practical information using real-world practices that address all aspects of on-wafer passive device characterization in the microwave frequency range up to 60GHz. Readers find data and measurements from silicon integrated passive devices fabricated and tested in advance CMOS technologies. Basic circuit equations, terms and fundamentals of time and frequency domain analysis are covered. This book also explores the basics of vector network analyzers (VNA), two port S-parameter measurement routines, signal flow graphs, network theory, error models and VNA calibrations with the use of calibration standards.