Logic Testing and Design for Testability

Logic Testing and Design for Testability
Author :
Publisher : MIT Press
Total Pages : 314
Release :
ISBN-13 : UCAL:B4164031
ISBN-10 :
Rating : 4/5 ( Downloads)

Book Synopsis Logic Testing and Design for Testability by : Hideo Fujiwara

Download or read book Logic Testing and Design for Testability written by Hideo Fujiwara and published by MIT Press. This book was released on 1985 with total page 314 pages. Available in PDF, EPUB and Kindle. Book excerpt: Design for testability techniques offer one approach toward alleviating this situation by adding enough extra circuitry to a circuit or chip to reduce the complexity of testing.


Logic Testing and Design for Testability Related Books

Logic Testing and Design for Testability
Language: en
Pages: 314
Authors: Hideo Fujiwara
Categories: Logic circuits
Type: BOOK - Published: 1985 - Publisher: MIT Press

DOWNLOAD EBOOK

Design for testability techniques offer one approach toward alleviating this situation by adding enough extra circuitry to a circuit or chip to reduce the compl
An Introduction to Logic Circuit Testing
Language: en
Pages: 99
Authors: Parag K. Lala
Categories: Technology & Engineering
Type: BOOK - Published: 2022-06-01 - Publisher: Springer Nature

DOWNLOAD EBOOK

An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits/syste
VLSI Test Principles and Architectures
Language: en
Pages: 809
Authors: Laung-Terng Wang
Categories: Technology & Engineering
Type: BOOK - Published: 2006-08-14 - Publisher: Elsevier

DOWNLOAD EBOOK

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve pro
Advanced VLSI Design and Testability Issues
Language: en
Pages: 379
Authors: Suman Lata Tripathi
Categories: Technology & Engineering
Type: BOOK - Published: 2020-08-18 - Publisher: CRC Press

DOWNLOAD EBOOK

This book facilitates the VLSI-interested individuals with not only in-depth knowledge, but also the broad aspects of it by explaining its applications in diffe
System-on-Chip Test Architectures
Language: en
Pages: 893
Authors: Laung-Terng Wang
Categories: Technology & Engineering
Type: BOOK - Published: 2010-07-28 - Publisher: Morgan Kaufmann

DOWNLOAD EBOOK

Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geom