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Language: en
Pages: 312
Pages: 312
Type: BOOK - Published: 2010 - Publisher: World Scientific
Electromigration in ULSI Interconnections provides a comprehensive description of the electro migration in integrated circuits. It is intended for both beginner
Language: en
Pages: 312
Pages: 312
Type: BOOK - Published: 2010-06-25 - Publisher: World Scientific
Electromigration in ULSI Interconnections provides a comprehensive description of the electromigration in integrated circuits. It is intended for both beginner
Language: en
Pages: 75
Pages: 75
Type: BOOK - Published: 2007 - Publisher:
Language: en
Pages: 154
Pages: 154
Type: BOOK - Published: 2011-03-28 - Publisher: Springer Science & Business Media
Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections provides a detailed description of the application of finite element met
Language: en
Pages: 290
Pages: 290
Experimental Studies of Electromigration in Advanced Interconnect Systems for Future ULSI Technology
Type: BOOK - Published: 1996 - Publisher:
