Advancing Metrology for Electrotechnology to Support the U.S. Economy
| Author | : Joanne Surette |
| Publisher | : DIANE Publishing |
| Total Pages | : 85 |
| Release | : 1999-04 |
| ISBN-13 | : 9780788177019 |
| ISBN-10 | : 078817701X |
| Rating | : 4/5 (1X Downloads) |
Download or read book Advancing Metrology for Electrotechnology to Support the U.S. Economy written by Joanne Surette and published by DIANE Publishing. This book was released on 1999-04 with total page 85 pages. Available in PDF, EPUB and Kindle. Book excerpt: Presents an overview of work completed in 1997 in the Electronics & Electrical Engineering Laboratory (EEEL) of the National Institute of Standards & Technology. Selected technological accomplishments in the following fields are detailed: semiconductors, magnetics, superconductors, low frequency, microwaves, lightwaves, video, power, electromagnetic compatibility, electronic data exchange, & national electrical standards. Includes a profile of EEEL & its programs, projects, executive structure, awards & recognition, & management staff. Photographs, graphs & diagrams.
