Scanning tunneling microscopy (STM) and atomic force microscopy (AFM) are powerful tools for surface examination. In the past, many STM and AFM studies led to e

The first U. S. Army Natick Research, Development and Engineering Center Atomic Force/Scanning Tunneling Microscopy (AFM/STM) Symposium was held on lune 8-10, 1

This book presents a unified view of the rapidly growing field of scanning tunneling microscopy and its many derivatives. After examining novel scanning-probe t

Revised and expanded second edition of the standard work on new techniques for studying solid surfaces.

This is an indespensible guide to both researchers in academia and industry who wish to perform tribological experiments more effectively. With an extensive ran