Atomic-scale Characterization of Interfaces and Defects in Electronic Heterostructures
| Author | : Lianfeng Fu |
| Publisher | : |
| Total Pages | : 382 |
| Release | : 2006 |
| ISBN-13 | : UCAL:X75364 |
| ISBN-10 | : |
| Rating | : 4/5 ( Downloads) |
Book Synopsis Atomic-scale Characterization of Interfaces and Defects in Electronic Heterostructures by : Lianfeng Fu
Download or read book Atomic-scale Characterization of Interfaces and Defects in Electronic Heterostructures written by Lianfeng Fu and published by . This book was released on 2006 with total page 382 pages. Available in PDF, EPUB and Kindle. Book excerpt:
