The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there

This description of the structure of simulators suitable for use in the design of digital electronic systems includes the compiled code and event driven algorit

Hurst, an editor at the Microelectronics Journal, analyzes common problems that electronics engineers and circuit designers encounter while testing integrated c

System-on-Chip Methodologies & Design Languages brings together a selection of the best papers from three international electronic design language conferences i