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Language: en
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Type: BOOK - Published: 1994-01-01 - Publisher: Artech House on Demand
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Type: BOOK - Published: 2013-11-11 - Publisher: Springer Science & Business Media
This wide-ranging book summarizes the current knowledge of radiation defects in semiconductors, outlining the shortcomings of present experimental and modelling
Language: en
Pages: 341
Pages: 341
Type: BOOK - Published: 2013-11-22 - Publisher: Springer Science & Business Media
The advent of the microelectronics technology has made ever-increasing numbers of small devices on a same chip. The rapid emergence of ultra-large-scaled-integr
Language: en
Pages: 360
Pages: 360
Type: BOOK - Published: 2000 - Publisher: Wiley-IEEE Press
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Language: en
Pages: 241
Pages: 241
Type: BOOK - Published: 2013-03-09 - Publisher: Springer Science & Business Media
Provides an overview of the physical basis of noise in semiconductor devices, and a detailed treatment of numerical noise simulation in small-signal conditions.