In 2002, the International Conference on Computer Aided Design (ICCAD) celebrates its 20th anniversary. This book commemorates contributions made by ICCAD to th

Uncertainty in key parameters within a chip and between different chips in the deep sub micron area plays a more and more important role. As a result, manufactu

This book contains extended and revised versions of the best papers presented at the 26th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integra

This book constitutes the proceedings of the 23rd International Conference on Theory and Applications of Satisfiability Testing, SAT 2020, which was planned to

This book constitutes the thoroughly refereed proceedings of the 8th International Conference on the Theory and Application of Cryptographic Techniques in Afric