This book presents in summary the state of our knowledge of oxide reliability. The articles have been written by experts who are among the most knowledgeable in

This book focuses on the experimental and theoretical aspects of the time-dependent breakdown of advanced dielectric films used in gigascale electronics. Covera

The book summarizes and compares recent advancements in the development of novel lateral power transistors (LDMOS devices) for integrated circuits in power elec

For many years, most computer architects have pursued one primary goal: performance. Architects have translated the ever-increasing abundance of ever-faster tra