Related Books

Microelectronic Test Patterns
Language: en
Pages: 28
Authors: Martin G. Buehler
Categories: Electronic apparatus and appliances
Type: BOOK - Published: 1974 - Publisher:

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Microelectronic test pattern NBS-3 for evaluating the resistivity-dopaut density relationship of silicon
Language: en
Pages: 64
Authors: Martin G. Buehler
Categories: Electronic apparatus and appliances
Type: BOOK - Published: 1976 - Publisher:

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Microelectronic Test Pattern NBS-4
Language: en
Pages: 96
Authors: W. Robert Thurber
Categories: Microelectronics
Type: BOOK - Published: 1978 - Publisher:

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Test Patterns NBS-28 and NBS-28A
Language: en
Pages: 60
Authors: Michael A. Mitchell
Categories: Electronic apparatus and appliances
Type: BOOK - Published: 1981 - Publisher:

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A Production-compatible Microelectronic Test Pattern for Evaluating Photomask Misalignment
Language: en
Pages: 40
Authors: Thomas James Russell
Categories: Integrated circuits
Type: BOOK - Published: 1979 - Publisher:

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