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High Performance Memory Testing
Language: en
Pages: 252
Authors: R. Dean Adams
Categories: Technology & Engineering
Type: BOOK - Published: 2005-12-29 - Publisher: Springer Science & Business Media

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Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each
Advances in Electronic Testing
Language: en
Pages: 431
Authors: Dimitris Gizopoulos
Categories: Technology & Engineering
Type: BOOK - Published: 2006-01-22 - Publisher: Springer Science & Business Media

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This is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic circuits testing. The book is a
Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits
Language: en
Pages: 690
Authors: M. Bushnell
Categories: Technology & Engineering
Type: BOOK - Published: 2006-04-11 - Publisher: Springer Science & Business Media

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The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there
High Performance and Hardware Aware Computing
Language: en
Pages: 80
Authors: Rainer Buchty
Categories: Computer architecture
Type: BOOK - Published: 2008 - Publisher: KIT Scientific Publishing

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Advanced Test Methods for SRAMs
Language: en
Pages: 179
Authors: Alberto Bosio
Categories: Technology & Engineering
Type: BOOK - Published: 2009-10-08 - Publisher: Springer Science & Business Media

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Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to defects